Resistivity Measurement System Suite, 4-Point Probe

Description

The objective of this acquisition is to provide the Department with a comprehensive, multi-environment resistivity measurement capability. This suite will support mission-critical analysis of semiconductor materials, thin films, and conductive polymers across a full range of physical and thermal conditions.

This Amendment to the Solicitation (SF30.pdf) is to reopen the solicitation to 9/18/2026 at 1500 EST due to a need for an update to the Performance Work Statement.

Please see attached Updated Performance Work Statement (PWS) (Updated PWS Tech Spec.pdf) for more specific technical information.

Classifications

NAICS

334516

Analytical Laboratory Instrument Manufacturing

31-33├Manufacturing

334├Computer and Electronic Product Manufacturing

3345├Navigational, Measuring, Electromedical, and Control Instruments Manufacturing

33451├Navigational, Measuring, Electromedical, and Control Instruments Manufacturing

334516└Analytical Laboratory Instrument Manufacturing

PSC

6640

LABORATORY EQUIPMENT AND SUPPLIES

66├INSTRUMENTS AND LABORATORY EQPT

6640└Laboratory Equipment and Supplies

Set-Aside

NONE

No Set aside used

Documents

Primary Contact

Secondary Contact